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Residual stress analysis of all perovskite oxide cantilevers

Vasta, Giuseppe and Jackson, Timothy J. and Frommhold, Andreas and Bowen, James and Tarte, Edward J. (2011) Residual stress analysis of all perovskite oxide cantilevers. Journal of Electroceramics, 27 (3-4). pp. 176-188. ISSN 1385-3449

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URL of Published Version: http://dx.doi.org/10.1007/s10832-011-9663-6

Identification Number/DOI: doi:10.1007/s10832-011-9663-6

We have used a method to experimentally determine the curvature of thin film multilayers in all oxide cantilevers. This method is applicable for large deflections and enables the radius of curvature of the beam, at a certain distance from the anchor,to be determined accurately. The deflections of the suspended beams are measured at different distances from the anchor point using SEM images and the expression of the deflection curve is calculated for each cantilever. With this expression it is possible to calculate the value of the radius of curvature at the free end of the cantilever. Together with measured values for the Youngs Modulus, this enabled us to determine the residual stress in each cantilever. This analysis has been applied to \(SrRuO_3/BaTiO_3/SrRuO_3\),\(BaTiO_3/MgO/SrTiO_3\) and \(BaTiO_3/SrTiO_3\) piezoelectric cantilevers and the results compared to two models in which the stresses are determined by lattice parameter mismatch or differences in thermal expansion coefficient. Our analysis shows that the bending of the beams is mainly due the thermal stress generated

Type of Work:Article
Date:2011 (Publication)
School/Faculty:Colleges (2008 onwards) > College of Engineering & Physical Sciences
Department:School of Electrical and Computer Engineering
Subjects:Q Science (General)
QC Physics
T Technology (General)
Institution:University of Birmingham
Copyright Holders:Springer
ID Code:1033
Refereed:YES
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