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High resolution studies of low-energy electron attachment to SF5Cl: Product anions and absolute cross sections

Braun, M. and Ruf, M.-W. and Hotop, H. and Cicman, P. and Scheier, P. and Mark, T. and Illenberger, E. and Tuckett, R. P. and Mayhew, C. A. (2006) High resolution studies of low-energy electron attachment to SF5Cl: Product anions and absolute cross sections. International Journal of Mass Spectrometry, 252 (3). pp. 234-241. ISSN 1387-3806

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URL of Published Version: http://dx.doi.org/10.1016/j.ijms.2006.03.008

Identification Number/DOI: doi:10.1016/j.ijms.2006.03.008

Low energy electron attachment to SF\(_5\)Cl was studied at high energy resolution by mass spectrometric detection of the product anions. Two variants of the laser photoelectron attachment (LPA) technique (Kaiserslautern) were used for determining the threshold behaviour of the yield for SF\(_5^-\) formation at about 1 meV resolution, and to investigate the relative cross sections for Cl\(^-\), FCl\(^-\), and SF\(_5^-\) formation towards higher energies (up to 1 eV) at about 20 meV resolution. Thermal swarm measurements (Birmingham) were used to place the relative LPA cross sections on an absolute scale. A trochoidal electron monochromator (Innsbruck) was used for survey measurements of the relative cross sections for the different product anions over the energy range of 0-14 eV with a resolution of 0.30 eV. Combined with earlier beam data (taken at Berlin, J. Chem. Phys. 88 (1988) 149), the present experimental results provide a detailed set of partial cross sections for anion formation in low-energy electron collisions with SF\(_5\)Cl.

Type of Work:Article
Date:2006 (Publication)
School/Faculty:Schools (1998 to 2008) > School of Chemical Sciences
Department:School of Chemistry, School of Physics
Subjects:QD Chemistry
QC Physics
Institution:University of Birmingham
Copyright Holders:Elsevier B.V.
ID Code:763
Refereed:YES
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